Title :
Application of viscoelastic model for simulating process-induced warpage of ball grid array packages
Author :
Gung, J.-L. ; Huang, H.-W. ; Chiu, T.-C. ; Lai, Y.-S.
Author_Institution :
Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
Warpage evolution of an overmolded BGA package either under uniform temperature excursion or during post-mold curing process is analyzed by using finite element simulation with a cure-dependent viscoelastic model for the molding compound. Additional finite element analyses are performed to compare molding compound constitutive behavior (temperature-dependent elastic or viscoelastic) on the package warpage prediction. Through shadow Moire¿ experimental validation, it is observed that the prediction with viscoelastic constitutive model agrees well to the measured values; while the elastic model overestimates package warpage.
Keywords :
ball grid arrays; finite element analysis; moire fringes; viscoelasticity; ball grid array packages; finite element simulation; post-mold curing process; process-induced warpage; shadow Moire experimental validation; uniform temperature excursion; viscoelastic model; Elasticity; Electronics packaging; Viscosity;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
DOI :
10.1109/IMPACT.2009.5382296