DocumentCode :
3132762
Title :
Blinking Artifact Removal in Cognitive EEG Data Using ICA
Author :
Li, Ruijiang ; Principe, Jose C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
5273
Lastpage :
5276
Abstract :
Eye blinking artifacts present serious problems for electroencephalographic (EEG) interpretation and analysis. In this study, we apply independent component analysis (ICA) to eye blinking artifact removal from cognitive EEG recordings. Due to the specific design of the experiment, the eye blinks almost always co-occur with the event-related potentials (ERP), which creates problems for ICA. We introduced another data set of spontaneous blink and combined it with single-trial ERP data. Our results show that ICA on the combined data set gives separation that makes more sense and makes it easier for EEG interpretation and analysis
Keywords :
bioelectric potentials; biomechanics; cognition; electroencephalography; eye; independent component analysis; EEG analysis; ICA; cognitive EEG; electroencephalographic interpretation; event-related potentials; eye blinking artifact removal; independent component analysis; Blind source separation; Brain modeling; Electroencephalography; Enterprise resource planning; Independent component analysis; Magnetic analysis; Muscles; Principal component analysis; Signal analysis; Source separation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.260605
Filename :
4462994
Link To Document :
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