DocumentCode :
3132773
Title :
Transient fault characterization in dynamic noisy environments
Author :
Polian, Ilia ; Hayes, John P. ; Kundu, Sandip ; Becker, Bernd
Author_Institution :
Albert-Ludwigs-Univ., Freiburg
fYear :
2005
fDate :
8-8 Nov. 2005
Lastpage :
1048
Abstract :
Technology trends are increasing the frequency of serious transient (soft) faults in digital systems. For example, ICs are becoming more susceptible to cosmic radiation, and are being embedded in applications with dynamic noisy environments. We propose a generic framework for representing such faults and characterizing them on-line. We formally define the impact of a transient fault in terms of three basic parameters: frequency, observability and severity. We distinguish fault modes in systems whose noise environment changes dynamically. Based on these ideas, the problem of designing on-line architectures for transient fault characterization is formulated and analyzed for several optimization goals. Finally, experiments are described that determine transient fault impact and the corresponding tests for various simulated fault modes of the ISCAS-89 benchmark circuits
Keywords :
circuit noise; fault diagnosis; integrated circuit testing; transient analysis; digital systems; dynamic noisy environments; on-line architectures; serious transient faults; soft faults; transient fault characterization; Circuit faults; Circuit noise; Circuit simulation; Circuit testing; Design optimization; Digital systems; Frequency; Observability; Transient analysis; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
Type :
conf
DOI :
10.1109/TEST.2005.1584070
Filename :
1584070
Link To Document :
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