DocumentCode :
3132867
Title :
MD study of damage structures with poly-atomic boron cluster implantation
Author :
Aoki, Takaaki ; Seki, Takaya ; Matsuo, Jiro
Author_Institution :
Kyoto Univ., Kyoto
fYear :
2007
fDate :
8-9 June 2007
Firstpage :
23
Lastpage :
24
Abstract :
The MD simulations of B monomer and small cluster implantation were performed. The non-linear effect for implant range was observed when the incident energy is as low as few hundreds eV/atom, where the B10 or B18 cluster implantation gives deeper implantation energy and so higher implant efficiency of dopants than that of B monomer or dimer. For damage formation, cluster implantation caused large number of collisions at narrow surface region, which results in high-density amorphization of impact area. This amorphization effect was observed at both low and high energy cluster ion implantation, and is expected to reduce enhanced diffusion and show good annihilation process.
Keywords :
amorphisation; boron; elemental semiconductors; ion implantation; molecular dynamics method; semiconductor doping; semiconductor junctions; silicon; B monomer; MD simulations; Si:B; annihilation process; damage structures; high energy cluster ion implantation; high-density amorphization; molecular dynamics simulations; nonlinear effect; polyatomic boron cluster implantation; small cluster implantation; Annealing; Atomic layer deposition; Boron; Fabrication; Implants; Ion implantation; Large scale integration; Lattices; Projectiles; Semiconductor process modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Junction Technology, 2007 International Workshop on
Conference_Location :
Kyoto
Print_ISBN :
1-4244-1103-3
Electronic_ISBN :
1-4244-1104-1
Type :
conf
DOI :
10.1109/IWJT.2007.4279937
Filename :
4279937
Link To Document :
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