A unified small signal model and an efficient parameter extraction technique for deep submicron MOSFETs for RF applications

Author

Ng, Tze Cheng ; Swe, Toe Naing ; Yeo, Kiat Seng ; Chew, Kok Wai ; Ma, Jianguo ; Do, Manh Anh

Author_Institution

Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore

fYear

2000

fDate

2000

Firstpage

128

Lastpage

131

Abstract

A new small signal model for deep submicron MOSFETs is presented. It is a unified model suitable for both baseband and RF simulation, and valid in both the triode and saturation regions. The model is implemented as a macro model with parasitic elements added to the BSIM3v3 core. The model extraction methodology is analogous to the “divide and conquer” strategy used in computer science. This approach is superior to the traditional method of optimizing the entire model to fit the measured S-parameters. It has shown an increase in accuracy and optimization speed while reducing convergence problems caused by global optimization. Excellent agreement between measured and simulated S-parameters at different biasing conditions in the range from 50 MHz to 15 GHz has been obtained

Keywords

MOSFET; S-parameters; UHF field effect transistors; convergence; microwave field effect transistors; optimisation; semiconductor device models; 50 MHz to 15 GHz; BSIM3v3 core; RF applications; RF simulation; S-parameters; baseband simulation; biasing conditions; convergence problems reduction; deep submicron MOSFETs; macro model; model extraction methodology; optimization speed; parameter extraction technique; parasitic elements; saturation region; triode region; unified small signal model; Computational modeling; Computer science; Data mining; Integrated circuit modeling; MOSFETs; Optimization methods; Parameter extraction; Radio frequency; Radiofrequency integrated circuits; Semiconductor device modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2000 Asia-Pacific

Conference_Location

Sydney, NSW

Print_ISBN

0-7803-6435-X

Type

conf

DOI

10.1109/APMC.2000.925738

Filename

925738