Title :
Single view metrology
Author :
Criminisi, A. ; Reid, I. ; Zisserman, A.
Author_Institution :
Dept. of Eng. Sci., Oxford Univ., UK
Abstract :
We describe how 3D affine measurements may be computed from a single perspective view of a scene given only minimal geometric information determined from the image. This minimal information is typically the vanishing line of a reference plane and a vanishing point for a direction not parallel to the plane. It is shown that affine scene structure may then be determined from the image, without knowledge of the camera´s internal calibration (e.g. focal length), nor of the explicit relation between camera and world (pose). In particular we show how to: compute the distance between planes parallel to the reference plane (up to a common scale factor); compute area and length ratios on any plane parallel to the reference plane; determine the camera´s (viewer´s) location. Simple geometric derivations are given for these results. We also develop an algebraic representation which unifies the three types of measurement and, amongst other advantages, permits a first order error propagation analysis to be performed, associating an uncertainty with each measurement. We demonstrate the technique for a variety of applications, including height measurements in forensic images and 3D graphical modelling from single images
Keywords :
calibration; cameras; height measurement; image processing; 3D affine measurements; 3D graphical modelling; affine scene structure; algebraic representation; calibration; camera; first order error propagation analysis; forensic images; geometric information; height measurements; single perspective view; single view metrology; vanishing line; vanishing point; Calibration; Cameras; Concurrent computing; Error analysis; Forensics; Layout; Measurement uncertainty; Metrology; Performance analysis; Performance evaluation;
Conference_Titel :
Computer Vision, 1999. The Proceedings of the Seventh IEEE International Conference on
Conference_Location :
Kerkyra
Print_ISBN :
0-7695-0164-8
DOI :
10.1109/ICCV.1999.791253