• DocumentCode
    3133009
  • Title

    Classification of Cervical Cancer Cells using FTIR Data

  • Author

    Njoroge, Erick ; Alty, Stephen R. ; Gani, Mahbub R. ; Alkatib, Maha

  • Author_Institution
    Center for Digital Signal Process. Res., King´´s Coll., London
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    5338
  • Lastpage
    5341
  • Abstract
    High false-negative rates of the Papanicolauo (so-called ´Pap´) smear test and the shortage of colposcopists have led to the desire to find alternative non-expert (automated) approaches for accurately testing cervical smears for signs of cancer. Fourier-Transform Infra-Red (FTIR) spectroscopy has been shown to offer the potential for improving the accuracy (i.e. sensitivity and specificity) of these tests. This paper details the application of the machine learning methodology of Support Vector Machines (SVM) using FTIR data to enhance and improve upon the standard Pap test. A cohort of 53 subjects was used to test the veracity of both the Pap smear results and the FTIR based classifier against the findings of the colposcopists. The Pap test achieved an overall classification of 43 %, whereas our method achieved a rate of 72%
  • Keywords
    Fourier transform spectroscopy; biological organs; cancer; cellular biophysics; gynaecology; learning (artificial intelligence); medical computing; pattern classification; support vector machines; tumours; FTIR data; Fourier-transform infrared spectroscopy; Pap test; SVM; cervical cancer cell classification; cervical smears; colposcopist; false-negative rate; machine learning; papanicolauo test; support vector machine; Automatic testing; Biopsy; Cervical cancer; Cities and towns; Humans; Infrared spectra; Sensitivity and specificity; Support vector machine classification; Support vector machines; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260024
  • Filename
    4463009