DocumentCode :
3133057
Title :
Investigation of the effect of the slot and shunt on the transient and steady state current response of a commercially available lighting ballast
Author :
Brosius, Bill ; Lambrecht, Robert ; Oesterlei, Robert ; Sadeghi, Hamid
Author_Institution :
Adv. Dev. Center, MagneTek Inc., USA
Volume :
4
fYear :
1996
fDate :
6-10 Oct 1996
Firstpage :
2095
Abstract :
Shunts and slots in electromagnetic ballasts control starting and steady state currents. Conventional methods of analysis fall short in an accurate qualitative and quantitative description of the effect of these important design parameters because their function can be explained only when steel saturation and material nonlinearity are considered. Because of the existence of the shunts, parallel paths for the flux lines exist, thus making conventional methods of analysis extremely difficult when nonlinear material characteristics have to be taken into account. As a result, this kind of electromagnetic ballast has traditionally been designed using more empirical rules and trial and error (build-test) methods than theoretical methods. This study tries to give a comprehensive understanding of the function of the shunts and slots in an electromagnetic ballast. The commercially available finite element package MSC/EMAS was used in this study. MKS units are used throughout the analysis
Keywords :
electrical engineering computing; electromagnetic devices; finite element analysis; lamp accessories; lighting; software packages; starting; MSC/EMAS software; design parameters; electromagnetic lighting ballasts; finite element package; material nonlinearity; parallel path flux lines; shunts; slots; steady-state current response; steel saturation; transient current response; Electromagnetic transients; Electronic ballasts; Finite element methods; Magnetic flux; Magnetic separation; Steady-state; Steel; Surges; Transient analysis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location :
San Diego, CA
ISSN :
0197-2618
Print_ISBN :
0-7803-3544-9
Type :
conf
DOI :
10.1109/IAS.1996.563864
Filename :
563864
Link To Document :
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