Title :
Automatic Chinese pronunciation error detection using SVM trained with structural features
Author :
Tongmu Zhao ; Hoshino, A. ; Suzuki, M. ; Minematsu, Nobuaki ; Hirose, Keikichi
Author_Institution :
Univ. of Tokyo, Tokyo, Japan
Abstract :
Pronunciation errors are often made by learners of a foreign language. To build a Computer-Assisted Language Learning (CALL) system to support them, automatic error detection is essential. In this study, Japanese learners of Chinese are focused on. We investigated in automatic detection of their typical and frequent phoneme production errors. For this aim, four databases are newly created and we propose a detection method using Support Vector Machine (SVM) with structural features. The proposed method is compared to two baseline methods of Goodness Of Pronunciation (GOP) and Likelihood Ratio (LR) under the task of phoneme error detection. Experiments show that the proposed method performs much better than both of the two baseline methods. For example, the false rejection rate is reduced by as much as 82%. However, the results also indicate some drawbacks of using SVM with structural features. In this paper, we discuss merits and demerits of the proposed method and in what kind of real applications it works effectively.
Keywords :
computational linguistics; computer aided instruction; error detection; natural languages; support vector machines; CALL system; GOP; Japanese learners; SVM; SVM training; automatic Chinese pronunciation error detection; baseline method; computer assisted language learning; false rejection rate; foreign language; frequent phoneme production errors; goodness of pronunciation; likelihood ratio; real applications; structural features; support vector machine; typical phoneme production errors; Databases; Feature extraction; Hidden Markov models; Speech; Support vector machines; Testing; Training; Chinese; GOP; LR; Pronunciation error detection; SVM; robustness; structural feature;
Conference_Titel :
Spoken Language Technology Workshop (SLT), 2012 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
978-1-4673-5125-6
Electronic_ISBN :
978-1-4673-5124-9
DOI :
10.1109/SLT.2012.6424270