Title :
Ultrafast Time-Resolved X-ray Diffraction of Coherent Phonons in Semiconductors
Author :
Nakamura, K.G. ; Hironaka, Y. ; Irisawa, J. ; Kondo, K.
Author_Institution :
Mater. & Struct. Lab., Tokyo Inst. of Technol., Yokohama
Abstract :
In this paper, we performed the femtosecond time-resolved X-ray diffraction on the 60-fs laser irradiated a CdTe single crystal and detected the coherent longitudinal optical (LO) phonon (5.07 THz) at Brilliuon zone center. The coherent LO phonon is also confirmed by using an optical reflectivity measurement
Keywords :
Brillouin zones; II-VI semiconductors; X-ray diffraction; cadmium compounds; high-speed optical techniques; laser beam effects; phonons; reflectivity; 5.07 THz; 60 fs; Brilliuon zone center; CdTe; CdTe single crystal; coherent longitudinal optical phonon; coherent phonons; laser irradiation; optical reflectivity measurement; semiconductor; ultrafast time-resolved X-ray diffraction; Atom optics; Atomic beams; Atomic measurements; Dielectric measurements; Optical diffraction; Phonons; Plasma measurements; Ultrafast optics; X-ray diffraction; X-ray lasers;
Conference_Titel :
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9555-7
Electronic_ISBN :
0-7803-9555-7
DOI :
10.1109/LEOS.2006.279111
