Abstract :
This article provides an overview on SoC´s on board testing. It discusses the topic of life cycle perspective, efficient test required, re-use challenges, test access and control, SoC DFT architecture, test sequencing, DFT support, and debug and diagnosis support
Keywords :
design for testability; printed circuit testing; system-on-chip; DFT support; SoC DFT architecture; life cycle perspective; on board testing; test access; test sequencing; Chip scale packaging; Circuit testing; Costs; Design for testability; Marketing management; Signal generators; Silicon; System testing; System-on-a-chip; Timing;
