Title :
Board and system test with SoC DFT
Author :
Robinson, Gordon D.
Abstract :
Testing an SoC in its chip manufacturing process is the simplest of the test problems that SoC and the DFT engineers working on its design will ever encounter. This article outlines the task and the challenges involved in DFT activities. It also tackled the implication of SoC DFT in later tests activities
Keywords :
design for testability; system-on-chip; SoC DFT; board test; chip manufacturing process; system test; Built-in self-test; Certification; Design engineering; Design for testability; Embedded software; Manufacturing processes; Software standards; Software testing; System testing; Universal Serial Bus;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584098
