Title :
How are we going to test SOC´s on a board?
Author :
Smith, Michael J.
Author_Institution :
Teradyne Inc., Boston, MA
Abstract :
This abstract discusses how the testing of SOC´s on boards can be addressed in the current manufacturing test environment
Keywords :
printed circuit manufacture; printed circuit testing; production testing; system-on-chip; SOC; manufacturing test environment; on board test; Testing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584099
