DocumentCode
3133212
Title
Analysis of arc spot ignition on cold lamp electrodes
Author
Schein, J. ; Schumann, M. ; Mentel, J.
Author_Institution
Ruhr-Univ., Bochum, Germany
Volume
4
fYear
1996
fDate
6-10 Oct 1996
Firstpage
2155
Abstract
The ignition of arc discharges in lamps does not proceed straightforwardly in many cases. The discharge remains in the state of a glow discharge since the formation of an arc spot at the cold cathode does not take place. To investigate the arc spot ignition on cold cathodes under defined conditions, a special experimental setup was developed. An arc ignited between horn electrodes in a clean argon gas atmosphere is blown magnetically against a third so-called commutation electrode which is negatively biased against the arc plasma. The ignition of arc spots on this cathode was investigated by electrical measurements and high speed photography. The arc traces of short current pulses were examined by in-situ optical microscopy of the cathode surface. It could be shown that the arc spot ignition is mainly determined by surface structures. These structures are able to produce local field enhancement factors in the order of 100 which raise the local electron emission more than any known depression of the work function. The results can be explained by a model in which a sufficiently high density of small emission sites produces by field emission locally such a high average current density that a plasma channel and an arc spot on the cathode surface is formed
Keywords
arc lamps; arcs (electric); cathodes; commutation; electric ignition; electron field emission; glow discharges; work function; arc discharges; arc spot ignition; average current density; cold cathodes; commutation electrode; discharge lamp electrodes; electrical measurements; field enhancement; glow discharge; high speed photography; horn electrodes; in-situ optical microscopy; local electron emission; plasma channel; work function; Arc discharges; Argon; Atmosphere; Cathodes; Electrodes; Glow discharges; Ignition; Lamps; Optical microscopy; Plasma measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location
San Diego, CA
ISSN
0197-2618
Print_ISBN
0-7803-3544-9
Type
conf
DOI
10.1109/IAS.1996.563873
Filename
563873
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