DocumentCode
3133213
Title
Is the concern for soft-error overblown?
Author
Kundu, Sandip
Author_Institution
Freescale Semicond., Austin, TX
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
1268
Abstract
This article gives a general perspective regarding soft error and how to deal with it. Finally it the author gives his position on issues in solving soft error problems
Keywords
integrated circuit reliability; radiation hardening (electronics); IC soft-error detection; radiation hardening; Dynamic voltage scaling; Energy management; Frequency; Ionizing radiation; Neutrons; Power engineering and energy; Power supplies; Process design; Random access memory; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584100
Filename
1584100
Link To Document