Title :
Is the concern for soft-error overblown?
Author_Institution :
Freescale Semicond., Austin, TX
Abstract :
This article gives a general perspective regarding soft error and how to deal with it. Finally it the author gives his position on issues in solving soft error problems
Keywords :
integrated circuit reliability; radiation hardening (electronics); IC soft-error detection; radiation hardening; Dynamic voltage scaling; Energy management; Frequency; Ionizing radiation; Neutrons; Power engineering and energy; Power supplies; Process design; Random access memory; Temperature;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584100
