DocumentCode :
3133252
Title :
A better approach to molecular implantation
Author :
Renau, A.
Author_Institution :
Varian Semicond. Equip. Assoc. Inc., Gloucester
fYear :
2007
fDate :
8-9 June 2007
Firstpage :
107
Lastpage :
112
Abstract :
A new approach to molecular implantation is presented. This is based on the use of carborane, a large and thermally stable boron molecule that can be ionized in a standard ion source. The modifications that are needed to allow it to run on a Varian VIISta HCS high current tool are discussed. Data is presented to show that the tool can use carborane for high productivity, energy contamination free boron implants. Data is also presented to demonstrate that this additional capability does not change the tool´s performance for other species and implants. The operation of the tool is described along with productivity and process data for 32 nm logic applications. Electrical data is also presented that illustrates excellent device performance.
Keywords :
DRAM chips; boron; ion implantation; logic devices; DRAM devices; Si:B - Interface; Varian VIISta HCS high current tool; carborane; electrical data; energy contamination; logic devices; molecular implantation; size 32 nm; thermal stability; thermally stable boron molecule; Boron; Contamination; Counting circuits; Doping; Implants; Ion sources; Logic devices; Productivity; Random access memory; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Junction Technology, 2007 International Workshop on
Conference_Location :
Kyoto
Print_ISBN :
1-4244-1103-3
Electronic_ISBN :
1-4244-1104-1
Type :
conf
DOI :
10.1109/IWJT.2007.4279960
Filename :
4279960
Link To Document :
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