Title :
Reducing the uncertainty in fluorescent lamp/ballast system compatibility
Author :
Ji, Yunfen ; Davis, Robert
Author_Institution :
Lighting Res. Center, Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
The traditional method of life testing for fluorescent lamps is to determine the median operating hours until failure for a large sample of lamps, when operated on a 3 hours on and 20 minutes off cycle. This method may take 3 years to get results. Because many new fluorescent lighting products have been introduced and many new manufacturers have entered the marketplace, the compatibility of fluorescent lamp/ballast system is of concern for manufacturers, specifiers, and end-users, who cannot wait 3 years to determine compatibility. To address this issue, some researchers have tried to develop methods to predict whether or not lamp/ballast combination will be compatible. This paper reviews different methods used to predict fluorescent lamp life, and discusses the importance of developing a reliable method for predicting fluorescent lamp/ballast compatibility. A pilot study using X-ray fluorescence is summarized, to demonstrate the potential of using this technique to better characterize the nature of the lamp/ballast system
Keywords :
X-ray applications; X-ray fluorescence analysis; fluorescence; fluorescent lamps; lamp accessories; life testing; thermionic emission; X-ray fluorescence; direct barium loss; fluorescent lamp life prediction; fluorescent lamp/ballast system compatibility; fluorescent lighting products; life testing; thermionic emitting properties; uncertainty reduction; Area measurement; Cathodes; Electrodes; Electronic ballasts; Fluorescence; Fluorescent lamps; Life testing; Manufacturing; Uncertainty; Voltage;
Conference_Titel :
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3544-9
DOI :
10.1109/IAS.1996.563878