Title :
Test compression - real issues and matching solutions
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR
Abstract :
Even though embedded test compression was commercially introduced only four years ago, it has already been broadly adopted as a mainstream DFT methodology. This article discusses the basic criteria for test compression, its strengths and weakness. It also provides the characteristics of EDT (embedded deterministic test) technology
Keywords :
design for testability; embedded systems; integrated circuit testing; semiconductor device testing; DFT methodology; EDT technology; embedded test compression; Automatic test pattern generation; Costs; Degradation; Design for testability; Fault detection; Fault diagnosis; Graphics; Logic design; Logic testing; Test equipment;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584114
