Title :
Methods for improving test compression
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX
Abstract :
The approach that the author takes for this panel is to start with a vanilla sequential linear decompressor and look at the results it obtains. Then the author adds different enhancements to it along the lines of the factors discussed here and see what impact these have on the results
Keywords :
automatic test pattern generation; built-in self test; semiconductor device testing; sequential circuits; ATPG; test compression; vanilla sequential linear decompressor; Automatic test pattern generation; Broadcasting; Circuit testing; Entropy; Hardware; Nonlinear equations; Sequential analysis; Sequential circuits; Upper bound; Vectors;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584115
