DocumentCode
3133470
Title
Have we overcome the challenges associated with SoC and multi-core testing?
Author
Raina, Rajesh
Author_Institution
Freescale Semicond., Austin, TX, USA
fYear
2005
fDate
8-10 Nov. 2005
Abstract
Today, the best way to overcome the challenges associated with SoC and multi-core testing is by avoiding them. This position statement argues how avoiding the challenges are actually good for the growth of SoC business.
Keywords
integrated circuit testing; system-on-chip; SoC testing; multicore testing; system-on-chip; Clocks; Consumer electronics; Cost function; Delay; Humans; Manufacturing; Microprocessors; Semiconductor device testing; System-on-a-chip; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584118
Filename
1584118
Link To Document