Title :
Today´s SOC test challenges
Author_Institution :
Virage Logic Corp., Fremont, CA
Abstract :
A set of SoC test challenges have been introduced a decade ago, as embedded core based design and hence multi-core SoCs started to become popular. The topic of this panel is to analyze the SoC test challenges and determine if they have already been solved or not
Keywords :
embedded systems; integrated circuit testing; system-on-chip; embedded cores; system-on-chip testing; Built-in self-test; Design engineering; Design for testability; Job shop scheduling; Logic design; Logic testing; Manufacturing; Redundancy; Silicon; Test equipment;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584120
