Title :
Panel synopsis: reducing high-speed/RF test cost: guaranteed by design or guaranteed to fail?
Author :
Haggag, H. ; Chatterjee, Avhishek
Author_Institution :
National Semicond. Corp., Santa Clara, CA
Abstract :
As new standards are developed, designing and developing tests for the new devices conforming to the emerging standards has become a necessity. Designing new products for emerging standards needs focused effort from design engineers. In a similar manner, test is becoming a critical part of the manufacturing cycle due to escalating tester costs, as the testing requirements for every standard are different in terms of test plan development as well as the test instrumentation necessary for production test
Keywords :
built-in self test; design for testability; standards; design for testability; production testing; test instrumentation; Built-in self-test; Circuit testing; Costs; Data communication; Design engineering; Design for testability; Product design; Radio frequency; Standards development; System testing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584121
