Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail?

Summary form only given. Test engineers are under tremendous pressure to reduce the test cost associated with wireless communication products. Identifying the best solution that reduces test cost without compromising product quality is a major challenge in the semiconductor industry. The guaranteed-by-design concept is achievable for digital and some low-frequency analog devices. In high-frequency analog devices and high-speed digital devices, other constraints limit our ability to guarantee the device specification