Title :
Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail?
Author :
Slamani, Mustapha
Author_Institution :
IBM, Essex Junction, VT
Abstract :
Summary form only given. Test engineers are under tremendous pressure to reduce the test cost associated with wireless communication products. Identifying the best solution that reduces test cost without compromising product quality is a major challenge in the semiconductor industry. The guaranteed-by-design concept is achievable for digital and some low-frequency analog devices. In high-frequency analog devices and high-speed digital devices, other constraints limit our ability to guarantee the device specification
Keywords :
analogue circuits; design for testability; digital circuits; analog devices; design for testability; device specifications; digital devices; wireless communication products; Bandwidth; Circuit testing; Costs; Design for testability; Integrated circuit interconnections; Integrated circuit modeling; Radio frequency; Sockets; Software libraries; System testing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584123
