• DocumentCode
    3133638
  • Title

    A functional test algorithm for the register forwarding and pipeline interlocking unit in pipelined microprocessors

  • Author

    Bernardi, P. ; Boyang, D. ; Ciganda, L. ; Sanchez, E. ; Reorda, M. Sonza ; Grosso, M. ; Ballan, O.

  • Author_Institution
    Politec. di Torino, DAUIN Torino, Turin, Italy
  • fYear
    2013
  • fDate
    16-18 Dec. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    When the result of a previous instruction is needed in the pipeline before it is available, a “data hazard” occurs. Register Forwarding and Pipeline Interlock (RF&PI) are mechanisms suitable to avoid data corruption and to limit the performance penalty caused by data hazards in pipelined microprocessors. Data hazards handling is part of the microprocessor control logic; its test can hardly be achieved with a functional approach, unless a specific test algorithm is adopted. In this paper we analyze the causes for the low functional testability of the RF&PI logic and propose some techniques able to effectively perform its test. In particular, we describe a strategy to perform Software-Based Self-Test (SBST) on the RF&PI unit. The general structure of the unit is analyzed, a suitable test algorithm is proposed and the strategy to observe the test responses is explained. The method can be exploited for test both at the end of manufacturing and in the operational phase. Feasibility and effectiveness of the proposed approach are demonstrated on both an academic MIPS-like processor and an industrial System-on-Chip based on the Power ArchitectureTM.
  • Keywords
    data handling; microprocessor chips; pipelines; RF&PI logic; SBST; academic MIPS-like processor; data corruption; data hazard; data hazard handling; functional approach; functional test algorithm; industrial system-on-chip; low-functional testability; microprocessor control logic; operational phase; performance penalty; pipelined microprocessors; power architecture; register forwarding-pipeline interlocking unit; software-based self-test; specific test algorithm; test responses; Decision support systems; SBST; processors; register forwarding; test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Symposium (IDT), 2013 8th International
  • Conference_Location
    Marrakesh
  • Type

    conf

  • DOI
    10.1109/IDT.2013.6727120
  • Filename
    6727120