Title :
Test the test experts: do we know what we are doing?
Author_Institution :
Synopsys, Inc., Mountain View, CA
Abstract :
ITC has organized an expert quiz panel comprised of the following experts: R. Aitken; A. Crouch; J. Patel; and T.W. Williams. E.J. McCluskey, the moderator, presents to the two teams of panelists a series of simple questions designed to reveal the panelists test domain knowledge. The topics include state of the art test technology issues such as compression, timing tests, new fault models, ATPG issues, standards, process variation, DFM-test and N-detect
Keywords :
automatic test pattern generation; circuit testing; fault diagnosis; ATPG issues; DFM-test; ITC; N-detect; compression; expert quiz panel; fault models; process variation; test experts; test technology issues; timing tests; Automatic test pattern generation; Integrated circuit testing; Semiconductor device testing; Timing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584136
