• DocumentCode
    3134082
  • Title

    Reliable and Real-Time Communication in Industrial Wireless Mesh Networks

  • Author

    Han, Song ; Zhu, Xiuming ; Mok, Aloysius K. ; Chen, Deji ; Nixon, Mark

  • Author_Institution
    Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2011
  • fDate
    11-14 April 2011
  • Firstpage
    3
  • Lastpage
    12
  • Abstract
    Industrial wireless mesh networks are deployed in harsh and noisy environments for process measurement and control applications. Compared with wireless community networks, they have more stringent requirements on communication reliability and real-time performance. Missing or delaying of the process data by the network may severely degrade the overall control performance. In this paper, we abstract the primary reliability requirements in typical industrial wireless mesh networks and define three types of reliable routing graphs for different communication purposes. We present efficient algorithms to construct them and describe the recovery mechanisms in the event of component failures. Based on these graphs, data link layer communication schedules are generated to achieve end-to-end real-time performance. We demonstrate through extensive experimental results that our algorithms can achieve highly reliable routing, improved communication latency and stable real-time communication in large-scale networks at the cost of modest overhead in device configuration.
  • Keywords
    data communication; graph theory; telecommunication network reliability; telecommunication network routing; wireless mesh networks; communication latency; communication reliability; data link layer communication schedules; industrial wireless mesh networks; process measurement; recovery mechanisms; routing graphs; wireless community networks; Downlink; Logic gates; Real time systems; Reliability; Routing; Schedules; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Real-Time and Embedded Technology and Applications Symposium (RTAS), 2011 17th IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1080-1812
  • Print_ISBN
    978-1-61284-326-1
  • Type

    conf

  • DOI
    10.1109/RTAS.2011.9
  • Filename
    5767133