Title :
Two methods for scattering matrix measurement of an n-port network
Author :
Lu, Hsin-Chia ; Chu, Tah-Hsiung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Two novel methods to acquire the scattering matrix of an n-port network from the measurements using a reduced-port network analyzer are developed. These methods can obtain the scattering matrix of an n-port network with the use of a two-port network analyzer. Experimental results of a four-port isolator show the good accuracy using the developed methods
Keywords :
S-matrix theory; microwave isolators; microwave measurement; multiport networks; network analysers; four-port isolator; n-port network; port reduction method; scattering matrix measurement; two-port network analyzer; Equations; Failure analysis; Isolators; Joining processes; Reflection; Scattering parameters;
Conference_Titel :
Microwave Conference, 2000 Asia-Pacific
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6435-X
DOI :
10.1109/APMC.2000.925864
