• DocumentCode
    3134616
  • Title

    Multi Subspaces Active Appearance Models

  • Author

    Yang, Junyeong ; Byun, Hyeran

  • Author_Institution
    Dept. of Comput. Sci., Yonsei Univ., Seoul
  • fYear
    2008
  • fDate
    17-19 Sept. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The original Active Appearance Model(AAM) uses the mean matrix of gradient matrixes instead of a gradient matrix which should be recomputed with respect to a varying parameter at a fitting phase. By this property, the original AAM can guarantee a fast fitting speed because it avoids computation of a gradient matrix of which a computation complexity is high. However, the fixed gradient matrix is not a good choice when the distribution of a training database is nonlinear because the mean can not represent the variation of a training database. To overcome this problem, this paper proposes multi subspaces AAM. First, we divide a training database into multi subspaces along the illumination direction, and build the independent AAM for each subspace. At a fitting phase, we adaptively choose a subspace well fit to a target image. However, the parameter update problem is occurred because a subspace can be changed during a fitting phase. To solve this problem, we propose a linear transform matrix on an eigenspace. In experiments, we apply the proposed method to Yale Face Database B and demonstrate that the method is robust for facial images under various illuminations.
  • Keywords
    curve fitting; face recognition; matrix algebra; visual databases; Yale Face Database; facial images; fitting phase; illumination direction; linear transform matrix; multisubspaces active appearance models; target image; training database; Active appearance model; Biomedical image processing; Computational efficiency; Computer science; Context modeling; Image databases; Lighting; Principal component analysis; Robustness; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automatic Face & Gesture Recognition, 2008. FG '08. 8th IEEE International Conference on
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4244-2153-4
  • Electronic_ISBN
    978-1-4244-2154-1
  • Type

    conf

  • DOI
    10.1109/AFGR.2008.4813334
  • Filename
    4813334