DocumentCode
3134789
Title
Analysis and characterization of thermoelectric module and heat exchanger performance in a hybrid system cooling application
Author
Campbell, L.A. ; Wagner, R. ; Simons, R.E.
Author_Institution
IBM Corp., Poughkeepsie, NY, USA
fYear
2011
fDate
20-24 March 2011
Firstpage
48
Lastpage
53
Abstract
A thermoelectric chiller is a potential replacement for sub-ambient refrigeration for electronics cooling applications, where the reliance on vapor compression refrigeration results in risk of cooling failure due to the mechanical nature of the compressor and electronic expansion valve. Another benefit of a thermoelectric chiller is that controllable cooling of the electronic component can be achieved regardless of ambient conditions, and the ultimate heat sink can be either air or facility water. The goal of the work described herein is to study a thermoelectric chiller with reasonable capacity (in Watts), coefficient of performance (COP), and reliability (mean time between failures, MTBF), for electronics cooling applications. Four sets of tests are presented: a thermoelectric module tested with a heater block and a cold plate (Figure 2), and thermoelectric heat exchanger tests where the thermoelectric module hot and cold sides are arranged in segregated loops (Figure 5), a single serial loop (Figure 6), and parallel loops (Figure 7).
Keywords
cooling; failure analysis; heat exchangers; heat sinks; thermoelectricity; coefficient of performance; compressor; cooling failure; electronic component; electronic expansion valve; electronics cooling; heat exchanger performance; heat sink; heater block; hybrid system cooling; parallel loops; reliability; single serial loop; subambient refrigeration; thermoelectric heat exchanger tests; thermoelectric module analysis; vapor compression refrigeration; Cold plates; Heat pumps; Mathematical model; Resistance heating; Water heating; liquid cooling; thermoelectric;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-61284-740-5
Type
conf
DOI
10.1109/STHERM.2011.5767177
Filename
5767177
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