• DocumentCode
    3134789
  • Title

    Analysis and characterization of thermoelectric module and heat exchanger performance in a hybrid system cooling application

  • Author

    Campbell, L.A. ; Wagner, R. ; Simons, R.E.

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • fYear
    2011
  • fDate
    20-24 March 2011
  • Firstpage
    48
  • Lastpage
    53
  • Abstract
    A thermoelectric chiller is a potential replacement for sub-ambient refrigeration for electronics cooling applications, where the reliance on vapor compression refrigeration results in risk of cooling failure due to the mechanical nature of the compressor and electronic expansion valve. Another benefit of a thermoelectric chiller is that controllable cooling of the electronic component can be achieved regardless of ambient conditions, and the ultimate heat sink can be either air or facility water. The goal of the work described herein is to study a thermoelectric chiller with reasonable capacity (in Watts), coefficient of performance (COP), and reliability (mean time between failures, MTBF), for electronics cooling applications. Four sets of tests are presented: a thermoelectric module tested with a heater block and a cold plate (Figure 2), and thermoelectric heat exchanger tests where the thermoelectric module hot and cold sides are arranged in segregated loops (Figure 5), a single serial loop (Figure 6), and parallel loops (Figure 7).
  • Keywords
    cooling; failure analysis; heat exchangers; heat sinks; thermoelectricity; coefficient of performance; compressor; cooling failure; electronic component; electronic expansion valve; electronics cooling; heat exchanger performance; heat sink; heater block; hybrid system cooling; parallel loops; reliability; single serial loop; subambient refrigeration; thermoelectric heat exchanger tests; thermoelectric module analysis; vapor compression refrigeration; Cold plates; Heat pumps; Mathematical model; Resistance heating; Water heating; liquid cooling; thermoelectric;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-61284-740-5
  • Type

    conf

  • DOI
    10.1109/STHERM.2011.5767177
  • Filename
    5767177