• DocumentCode
    3135235
  • Title

    Facial feature detection with optimal pixel reduction SVM

  • Author

    Nguyen, Minh Hoai ; Perez, Joan ; De La Torre, Fernando

  • Author_Institution
    Robot. Inst., Carnegie Mellon Univ., Pittsburgh, PA
  • fYear
    2008
  • fDate
    17-19 Sept. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Automatic facial feature localization has been a long-standing challenge in the field of computer vision for several decades. This can be explained by the large variation a face in an image can have due to factors such as position, facial expression, pose, illumination, and background clutter. Support Vector Machines (SVMs) have been a popular statistical tool for facial feature detection. Traditional SVM approaches to facial feature detection typically extract features from images (e.g. multiband filter, SIFT features) and learn the SVM parameters. Independently learning features and SVM parameters might result in a loss of information related to the classification process. This paper proposes an energy-based framework to jointly perform relevant feature weighting and SVM parameter learning. Preliminary experiments on standard face databases have shown significant improvement in speed with our approach.
  • Keywords
    computer vision; face recognition; feature extraction; image classification; learning (artificial intelligence); statistical analysis; support vector machines; SVM parameter learning; automatic facial feature localization; computer vision; energy-based framework; facial feature detection; feature extraction; feature weighting; image classification; optimal pixel reduction; statistical tool; support vector machine; Computer vision; Data mining; Face detection; Facial features; Feature extraction; Filters; Image databases; Lighting; Support vector machine classification; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automatic Face & Gesture Recognition, 2008. FG '08. 8th IEEE International Conference on
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4244-2153-4
  • Electronic_ISBN
    978-1-4244-2154-1
  • Type

    conf

  • DOI
    10.1109/AFGR.2008.4813372
  • Filename
    4813372