DocumentCode :
3135515
Title :
Thermal imaging of encapsulated LEDs
Author :
Kendig, Dustin ; Yazawa, Kazuaki ; Shakouri, Ali
Author_Institution :
Microsanj, Cupertino, CA, USA
fYear :
2011
fDate :
20-24 March 2011
Firstpage :
310
Lastpage :
313
Abstract :
Thermoreflectance imaging is used to obtain 2D temperature maps of encapsulated LED arrays and elements with sub-micron spatial resolution. Typical LED encapsulation is opaque for infrared light, which prevents direct measurement of the semiconductor die with infrared cameras and thermocouples. A lock-in transient imaging technique with a megapixel silicon CCD is used to obtain the thermoreflectance and electroluminescence signals simultaneously. Transient thermal response in different locations of the die is characterized. Different thermal time constants are observed which correspond to various heat transfer mechanisms.
Keywords :
CCD image sensors; electroluminescence; encapsulation; heat transfer; infrared imaging; light emitting diodes; thermocouples; thermoreflectance; 2D temperature maps; electroluminescence signals; encapsulated LED arrays; heat transfer; infrared cameras; infrared light; lock-in transient imaging; megapixel silicon CCD; semiconductor die; sub-micron spatial resolution; thermal imaging; thermocouples; thermoreflectance imaging; transient thermal response; Electroluminescence; Imaging; Light emitting diodes; Reflectivity; Semiconductor device measurement; Temperature measurement; Transient analysis; LED; Thermoreflectance; heating; reliability; thermography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
Conference_Location :
San Jose, CA
ISSN :
1065-2221
Print_ISBN :
978-1-61284-740-5
Type :
conf
DOI :
10.1109/STHERM.2011.5767216
Filename :
5767216
Link To Document :
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