DocumentCode :
3135531
Title :
Low-temperature CAIBE processes for InP-based optoelectronics
Author :
Daleiden, J. ; Eisele, K. ; Ralston, J.D. ; Vollrath, G. ; Fiedler, F.
Author_Institution :
Fraunhofer-Inst. fur Angewandte Festkorperphys., Freiburg, Germany
fYear :
1995
fDate :
9-13 May 1995
Firstpage :
632
Lastpage :
635
Abstract :
We have developed Cl2/Ar and IBr3/Ar chemically-assisted ion-beam etching (CAIBE) processes, which allow high-quality etching of InP-based materials such as laser mirrors and gratings at low substrate temperatures (≈0°C). Etch rates of 400-750 Å/min and excellent surface morphologies at substrate temperatures between -5°C and +10°C with both Cl2/Ar and IBr3/Ar process (400 V Ar ion beam) are achieved. These low temperatures have allowed us to utilize UV-baked photoresists as well as PMMA as etch masks, facilitating very simply process development. Higher substrate temperatures (+50°C to +120°C) yield still higher etch rates, but at the expense of severely degraded surface morphologies. An InGaAsP/InP (1.55 μm) bulk laser with one facet etched the other cleaved is demonstrated, and compared with a both facets cleaved laser
Keywords :
III-V semiconductors; indium compounds; optical fabrication; semiconductor lasers; sputter etching; -5 to 10 C; 1.55 micron; 50 to 120 C; Ar; Cl2; IBr3; InGaAsP-InP; InP-based optoelectronics; PMMA; UV-baked photoresists; chemically-assisted ion-beam etching; gratings; laser mirrors; low-temperature CAIBE; masks; surface morphologies; Argon; Chemical lasers; Chemical processes; Etching; Gratings; Ion beams; Mirrors; Optical materials; Surface morphology; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
Conference_Location :
Hokkaido
Print_ISBN :
0-7803-2147-2
Type :
conf
DOI :
10.1109/ICIPRM.1995.522223
Filename :
522223
Link To Document :
بازگشت