DocumentCode
3135624
Title
Notes
fYear
2011
fDate
20-24 March 2011
Firstpage
1
Lastpage
1
Abstract
This page or pages intended for user notes.
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-61284-740-5
Type
conf
DOI
10.1109/STHERM.2011.5767222
Filename
5767222
Link To Document