Title :
Reliability of the shuffle-exchange network and its variants
Author :
Blake, James T. ; Trivedi, Kishor S.
Author_Institution :
Dept. of Comput. Sci., Duke Univ., Durham, NC, USA
Abstract :
The reliability of the shuffle-exchange multistage interconnection network (SEN) and two variations of this network aimed at improving reliability through fault tolerance is considered. The two variations are the SEN with an extra stage and the redundant SEN. Exact closed-form expressions are derived for the time-dependent reliability of the 8*8 and 16*16 SEN and SEN with an extra stage (SEN+). A tight-reliability lower bound that is useful for the analysis of larger networks is derived. Numerical results are provided for networks as large as 1024*1024. A comparison of these networks shows that on the basis of reliability, the SEN+ is superior to the SEN and the redundant SEN.<>
Keywords :
fault tolerant computing; multiprocessor interconnection networks; redundancy; extra stage; fault tolerance; multistage interconnection network; redundant shuffle-exchange network; time-dependent reliability; Bandwidth; Communication switching; Computer network reliability; Costs; Fault tolerance; Multiprocessing systems; Multiprocessor interconnection networks; Packet switching; Performance analysis; Switches;
Conference_Titel :
System Sciences, 1988. Vol.I. Architecture Track, Proceedings of the Twenty-First Annual Hawaii International Conference on
Conference_Location :
Kailua-Kona, HI, USA
Print_ISBN :
0-8186-0841-2
DOI :
10.1109/HICSS.1988.11763
