• DocumentCode
    3136302
  • Title

    Stochastic characterization of the phase noise spectrum of coupled-oscillator circuits

  • Author

    Suarez, Almudena ; Sancho, Sergio ; Ramirez, Franco

  • Author_Institution
    Dipt. Ing. de Comun., Univ. de Cantabria, Santander, Spain
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    564
  • Lastpage
    567
  • Abstract
    This paper presents the phase-noise analysis of nearest-neighbor coupled-oscillator circuits for beam steering applications. The analysis includes the effect of flicker noise sources for the first time to our knowledge. It is based on a semi-analytical formulation, which uses a perturbation model of the individual oscillator extracted from a harmonic balance (HB) simulation of the individual oscillator element in free-running conditions. The model can be extracted from a commercial HB using two auxiliary generators at dc and the first harmonic component. The operation range, stability and phase noise of the coupled system are analyzed separately from HB with the extended semi-analytical formulation. A full stochastic characterization of the phase-noise spectrum from the variance of the phase-deviation is presented, which enables an accurate prediction of the near-carrier noise. The method has been applied to a system of four oscillators, obtaining good agreement with the measurement results.
  • Keywords
    beam steering; circuit stability; flicker noise; harmonics; oscillators; phase noise; auxiliary generator; beam steering application; flicker noise sources; harmonic balance simulation; near-carrier noise; nearest-neighbor coupled-oscillator circuits; oscillator element; perturbation model; phase deviation; phase noise spectrum; stability; stochastic characterization; 1f noise; Beam steering; Circuit simulation; Coupling circuits; DC generators; Optical coupling; Oscillators; Phase noise; Stability analysis; Stochastic resonance; Coupled-oscillator system; near carrier noise; phase noise analysis; stability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5517243
  • Filename
    5517243