DocumentCode :
3136308
Title :
RBF shape histograms and their application to 3D face processing
Author :
Pears, Nick
Author_Institution :
Dept. of Comput. Sci., Univ. of York, York
fYear :
2008
fDate :
17-19 Sept. 2008
Firstpage :
1
Lastpage :
8
Abstract :
We present novel, pose invariant 3D shape descriptors and we test the performance of these descriptors, when applied to the problems of nose identification and localisation in 3D face data. We generate an implicit radial basis function (RBF) model of the facial surface and construction of our novel features is based on sampling this RBF model over a set of concentric spheres to give a spherically-sampled RBF (SSR) histogram. In addition to providing a feature identification mechanism, SSR histograms can be processed, with very little computational overhead, to estimate the volumetric intersection of the object (face) and a bounding sphere, centred on any object surface point. A minimisation of this volume, at an appropriate scale, can be used to both define and localise the facial nose tip to an arbitrary resolution. We test our descriptors on a subset of the particularly challenging University of York 3D face database. This data set consists of 1736 3D faces, with facial expression variations, pose variations, data spikes and missing parts. Noses vertices are identified at a rate of 99.6% on unseen subjects and our approach significantly outperforms three variants of spin images.
Keywords :
edge detection; face recognition; pose estimation; radial basis function networks; 3D face processing; RBF shape histograms; University of York 3D face database; feature identification mechanism; nose identification; nose localisation; pose invariant 3D shape descriptors; radial basis function model; spherically-sampled RBF histogram; Application software; Computer science; Face recognition; Filters; Histograms; Image databases; Nose; Sampling methods; Shape; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automatic Face & Gesture Recognition, 2008. FG '08. 8th IEEE International Conference on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4244-2153-4
Electronic_ISBN :
978-1-4244-2154-1
Type :
conf
DOI :
10.1109/AFGR.2008.4813442
Filename :
4813442
Link To Document :
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