DocumentCode
3136317
Title
Analysis of the Correlation between Local Field Potentials and Neuronal Firing Rate in the Motor Cortex
Author
Wang, Yiwen ; Sanchez, Justin C. ; Principe, Jose C. ; Mitzelfelt, Jeremiah D. ; Gunduz, Aysegul
Author_Institution
Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
6185
Lastpage
6188
Abstract
Neuronal firing rate has been the signal of choice for invasive motor brain machine interfaces (BMI). The use of local field potentials (LFP) in BMI experiments may provide additional dendritic information about movement intent and may improve performance. Here we study the time-varying amplitude modulated relationship between local field potentials (LFP) and single unit activity (SUA) in the motor cortex. We record LFP and SUA in the primary motor cortex of rats trained to perform a lever pressing task, and evaluate the correlation between pairs of peri-event time histograms (PETH) and movement evoked local field potentials (mEP) at the same electrode. Three different correlation coefficients were calculated and compared between the neuronal PETH and the magnitude and power of the mEP. Correlation as high as 0.7 for some neurons occurred between the PETH and the mEP magnitude. As expected, the correlations between the single trial LFP and SUV are much lower due to the inherent variability of both signals
Keywords
bioelectric potentials; biomechanics; medical computing; neurophysiology; user interfaces; correlation analysis; dendritic information; invasive motor brain machine interfaces; lever pressing task; movement evoked local field potentials; neuronal firing rate; neuronal peri-event time histograms; primary motor cortex; single unit activity; time-varying amplitude modulated relationship; Amplitude modulation; Cities and towns; Electrodes; Frequency domain analysis; Humans; Neurons; Rats; Surfaces; Tuning; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260516
Filename
4463221
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