• DocumentCode
    3136469
  • Title

    Nonlinear Analysis of Anesthesia Dynamics by Fractal Scaling Exponent

  • Author

    Gifani, P. ; Rabiee, H.R. ; Hashemi, M.R. ; Taslimi, P. ; Ghanbari, M.

  • Author_Institution
    Amirkabir Univ. of Technol., Tehran
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    6225
  • Lastpage
    6228
  • Abstract
    The depth of anesthesia estimation has been one of the most research interests in the field of EEG signal processing in recent decades. In this paper we present a new methodology to quantify the depth of anesthesia by quantifying the dynamic fluctuation of the EEG signal. Extraction of useful information about the nonlinear dynamic of the brain during anesthesia has been proposed with the optimum Fractal Scaling Exponent. This optimum solution is based on the best box sizes in the Detrended Fluctuation Analysis (DFA) algorithm which have meaningful changes at different depth of anesthesia. The Fractal Scaling Exponent (FSE) Index as a new criterion has been proposed. The experimental results confirm that our new Index can clearly discriminate between aware to moderate and deep anesthesia levels. Moreover, it significantly reduces the computational complexity and results in a faster reaction to the transients in patients´ consciousness levels in relations with the other algorithms
  • Keywords
    drugs; electroencephalography; fractals; medical signal processing; nonlinear dynamical systems; DFA algorithm; EEG signal processing; anesthesia depth estimation; brain; detrended fluctuation analysis; dynamic fluctuation; fractal scaling exponent; nonlinear analysis; Algorithm design and analysis; Anesthesia; Computational complexity; Data mining; Doped fiber amplifiers; Electroencephalography; Fluctuations; Fractals; Signal processing; Signal processing algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260501
  • Filename
    4463231