Title :
Stable haptic interaction for AFM-based nanomanipulation
Author :
Lim, Yo-An ; Gyu Lee, Chang ; Kim, Jong-Phil ; Ryu, Jeha
Author_Institution :
Dept. of Mechatron., Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
Abstract :
This paper addresses stable haptic interaction for AFM (atomic force microscope)-based nanomanipulation. The EBA (energy-bounding algorithm), a passivity-based haptic control algorithm, is modified to include the scaling factors in the scaled bilateral teleoperation, and a commercial AFM is revised to be used as a nanomanipulation system with a 1-DOF custom-built haptic interface. Preliminary experiments show that the modified EBA can maintain stability during the interaction between an AFM probe and the surface of a sample for any force scaling factors.
Keywords :
atomic force microscopy; haptic interfaces; manipulators; nanotechnology; AFM; atomic force microscope-based nanomanipulation; energy-bounding algorithm; force scaling factors; haptic interaction; passivity-based haptic control algorithm; scaled bilateral teleoperation; scaling factors; Atomic force microscopy; Force control; Force feedback; Haptic interfaces; Humans; Nanoscale devices; Nanostructured materials; Paper technology; Probes; Stability;
Conference_Titel :
Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4347-5
Electronic_ISBN :
978-1-4244-4349-9
DOI :
10.1109/ISIE.2009.5222558