Title : 
A compact flip chip single die WiFi FEM for smart phone application
         
        
            Author : 
Yuen, Cindy ; Laursen, Kirk ; Chu, Duc ; Pao, Yi-ching ; Chernyakov, Alexander ; Heide, Patric
         
        
            Author_Institution : 
Epic Commun., Inc., CA, USA
         
        
        
        
        
        
            Abstract : 
A flip chip single die WiFi FEM is developed using Bi-FET (HBT+E/D-PHEMT) technology for smart phone application. High thermal conductive copper-pillar bumps were developed for the flip chip process. This FEM flip chip die consists of a high-pass filter (HPF), a 2 GHz WiFi PA with on-chip regulator, PAON logic and detector circuit, and an SP3T. It showed good over-voltage and over-temperature performance when mounted on test LTCC module. Thermal modeling and design optimization kept junction temperatures comparable to wirebond versions of the design. A complete WiFi front-end LTCC module was developed using flip chip FEIC, integrated balun and SAW filter, with 3.2 mm × 3.2 mm size for Smart Phone Application.
         
        
            Keywords : 
flip-chip devices; high-pass filters; mobile handsets; wireless LAN; Bi-FET; FEM flip chip die; PAON logic; WiFi PA; WiFi front-end LTCC module; compact flip chip single die WiFi FEM; design optimization; detector circuit; flip chip process; high thermal conductive copper-pillar bumps; high-pass filter; on-chip regulator; smart phone; thermal modeling; Circuit testing; Design optimization; Detectors; Filters; Flip chip; Logic circuits; Regulators; Smart phones; Temperature; Thermal conductivity; Copper Pillar; FEM; Flip Chip; Front-End IC; LTCC; Smart Phone; Solder Bump; WiFi;
         
        
        
        
            Conference_Titel : 
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
         
        
            Conference_Location : 
Anaheim, CA
         
        
        
            Print_ISBN : 
978-1-4244-6056-4
         
        
            Electronic_ISBN : 
0149-645X
         
        
        
            DOI : 
10.1109/MWSYM.2010.5517297