• DocumentCode
    3137393
  • Title

    A Unified Approach to Test Data Analysis

  • Author

    Gianfagna, Michael A.

  • Author_Institution
    RCA Corporation Solid State Technology Center, Somerville, NJ
  • fYear
    1978
  • fDate
    19-21 June 1978
  • Firstpage
    117
  • Lastpage
    124
  • Abstract
    To provide cost-effective performance evaluation or engineering feedback from circuit test results often requires that complex analyses be performed on large volumes of non-standard data. Using a large scale data management system and a modular design philosophy, a system to cope with the above requirements has been developed. TDAS (Test Data Analysis System) has provided timely and economic solutions to test data analysis problems which might have been intractable by other means.
  • Keywords
    Automatic testing; Circuit testing; Data analysis; Electronic equipment testing; Histograms; Integrated circuit reliability; Performance analysis; Performance evaluation; Semiconductor device measurement; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1978. 15th Conference on
  • Type

    conf

  • DOI
    10.1109/DAC.1978.1585157
  • Filename
    1585157