DocumentCode
3137393
Title
A Unified Approach to Test Data Analysis
Author
Gianfagna, Michael A.
Author_Institution
RCA Corporation Solid State Technology Center, Somerville, NJ
fYear
1978
fDate
19-21 June 1978
Firstpage
117
Lastpage
124
Abstract
To provide cost-effective performance evaluation or engineering feedback from circuit test results often requires that complex analyses be performed on large volumes of non-standard data. Using a large scale data management system and a modular design philosophy, a system to cope with the above requirements has been developed. TDAS (Test Data Analysis System) has provided timely and economic solutions to test data analysis problems which might have been intractable by other means.
Keywords
Automatic testing; Circuit testing; Data analysis; Electronic equipment testing; Histograms; Integrated circuit reliability; Performance analysis; Performance evaluation; Semiconductor device measurement; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1978. 15th Conference on
Type
conf
DOI
10.1109/DAC.1978.1585157
Filename
1585157
Link To Document