DocumentCode :
3137443
Title :
Design and implementation of an integrated remote test system for mobile phones
Author :
Bai, Ying-Wen ; Chang, Chia-Yi
Author_Institution :
Dept. of Electron. Eng., Fu Jen Catholic Univ., Taipei, Taiwan
fYear :
2009
fDate :
5-8 July 2009
Firstpage :
1310
Lastpage :
1315
Abstract :
In this paper we design three programs, the first one is an automatic network RF signal measurement (ANRSM), the second one is automatic RF module and baseband hardware device self-diagnosis SmartMobileTest, and the last one is RF remote control test program (RRCTP). The greatest advantages of our ANRSM and our SmartMobileTest are that they are of a small size with portability, and that they reduce both the test time and the complexity of RF test programs. Our ANRSM is written in C++ language. This program uses the embedded 3GPP RF Spec TS 51.010 and by means of virtual instrument software architecture (VISA) controls the General Purpose Interface Bus (GPIB) which is used to control the RF base station simulator. Moreover we use LabVIEW and Web publishing technology to develop RRCTP to implement the remote control and command exchange. The SmartMobileTest program is created on a Windows Mobile OS to test the function of the RF and baseband module. Both our ANRSM and our SmartMobileTest support RF automatic testing and detection for the hardware performance of all the RF and baseband modules in a Smartphone. By combining these two programs we are able to identify the effect of both RF sensitivity and noise quickly.
Keywords :
3G mobile communication; Internet; mobile computing; mobile handsets; peripheral interfaces; telecommunication equipment testing; 3GPP; C++ language; LabVIEW; RF automatic testing; RF base station simulator; RF detection; RF remote control test program; RF sensitivity; SmartMobileTest; Web publishing; Windows Mobile OS; automatic RF module; automatic network RF signal measurement; baseband hardware device self-diagnosis; command exchange; general purpose interface bus; integrated remote test system; mobile phones; noise effect; virtual instrument software architecture; Automatic control; Automatic testing; Baseband; Hardware; Instruments; Mobile handsets; Radio frequency; Signal design; Software architecture; System testing; 3GPP; Noise; Reliability; Sensitivity; Smartphone;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4347-5
Electronic_ISBN :
978-1-4244-4349-9
Type :
conf
DOI :
10.1109/ISIE.2009.5222622
Filename :
5222622
Link To Document :
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