• DocumentCode
    3137657
  • Title

    Analytical modeling of base transit time considering recombination in the non-uniformly doped base

  • Author

    Chowdhury, M.I.B. ; Hassan, M. M Shahidul

  • Author_Institution
    Dept. of Electr. & Electron. Eng., United Int. Univ., Dhaka, Bangladesh
  • fYear
    2011
  • fDate
    6-7 June 2011
  • Firstpage
    117
  • Lastpage
    122
  • Abstract
    The main objective of this paper is to show that recombination in the base needs to be taken into account in determining base transit time τB. In previous analytical works for τB, recombination in the base was neglected. In this paper both drift and diffusion currents for electron and hole are considered in obtaining minority carrier profile n(x). In the model, both SRH and Auger recombination are considered. The energy-bandgap-narrowing effects due to heavy doping, velocity saturation as well as doping and field dependent mobility are considered. The model shows that recombination has significant effects on the base transit time of a heavily doped base.
  • Keywords
    Auger effect; bipolar transistors; diffusion; doping; electron-hole recombination; energy gap; network synthesis; Auger recombination; base transit time; base transit time τB; carrier profile; diffusion current; drift current; energy-bandgap-narrowing effects; field dependent mobility; heavily doped base; heavy doping; non-uniformly doped base; velocity saturation; Approximation methods; Current density; Differential equations; Doping; Equations; Mathematical model; Spontaneous emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Humanities, Science & Engineering Research (SHUSER), 2011 International Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4577-0263-1
  • Type

    conf

  • DOI
    10.1109/SHUSER.2011.6008482
  • Filename
    6008482