Title :
Electrical Noise Analysis of an Integrated Patch-Clamp Amplifier
Author :
Weerakoon, Pujitha ; Klemic, Kate ; Sigworth, Fred J. ; Culurciello, Eugenio
Author_Institution :
Yale Univ., New Haven
Abstract :
This paper presents an evaluation of electrical noise sources and signal-to-noise limitations in a fabricated integrated patch-clamp amplifier. We also present numerical calculation of the theoretical noise of the patch-clamp system. Our fabricated device was measured to have less than 4pA of rms noise at 10 kHz bandwidth, similar in performance to commercial bench- top systems. The integrated patch-clamp can accurately measure nano-Amperes of current and is intended for a high-throughput system that can screen a large number of cells in parallel. The fabricated device consumes 1480 by 1300 mum of silicon area and 3.2 mW at 3.3 V of power. The device was fabricated using AMI 0.5 mA Micron technology.
Keywords :
biomedical electronics; biosensors; integrated circuit noise; low noise amplifiers; semiconductor device noise; electrical noise analysis; integrated patch-clamp amplifier; micron technology; nanoAmpere current measurement; power 3.2 mW; voltage 3.3 V; Bandwidth; Biomembranes; Biosensors; Cells (biology); Current measurement; Instruments; Medical diagnostic imaging; Radiofrequency amplifiers; Signal to noise ratio; Voltage;
Conference_Titel :
Biomedical Circuits and Systems Conference, 2007. BIOCAS 2007. IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
978-1-4244-1524-3
Electronic_ISBN :
978-1-4244-1525-0
DOI :
10.1109/BIOCAS.2007.4463302
