Title :
EBT: A Comprehensive Test Generation Technique for Highly Sequential Circuits
Author :
Marlett, Ralph A.
Author_Institution :
Westinghouse Electric Corporation, Baltimore, MD
Abstract :
A new test generation technique for highly sequential circuits, utilizing functional models, with ability to produce tests for specific faults while avoiding races, is presented.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Logic circuits; Logic devices; Logic testing; Production; Sequential analysis; Sequential circuits; Signal generators;
Conference_Titel :
Design Automation, 1978. 15th Conference on
DOI :
10.1109/DAC.1978.1585194
