• DocumentCode
    3138059
  • Title

    A 6.5kV ESD-protected low noise amplifier in 65-nm CMOS

  • Author

    Tsai, Mavis ; Hsueh, Fu-Lung ; Jou, Christina F. ; Song, Min ; Tseng, J. ; Hsu, Steven ; Chen, S.

  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    A new ESD topology is proposed for RF low-noise amplifier (LNA). By using the modified silicon-controlled rectifier (MSCR) in conjunction with a P+/N-well diode clamp, a 5.8-GHz LNA with 6.5-kV ESD protection circuit is demonstrated by a 65-nm CMOS technology. Compared with the reference design, the new topology enhances the ESD level from 3.5 kV to 6.5 kV for human body model (HBM) while the noise figure (NF) is only 0.13 dB higher. Under a supply voltage of 1.2 V and drain current of 6.5 mA, the proposed ESD-protected LNA has a NF of 2.57 dB with an associated power gain of 16.7 dB. The input third-order intercept point (IIP3) is -11 dBm and the input and output return losses are below -15.9 dB and -20 dB, respectively.
  • Keywords
    CMOS integrated circuits; electrostatic discharge; low noise amplifiers; radiofrequency amplifiers; rectifiers; CMOS technology; ESD protection circuit; ESD topology; ESD-protected low noise amplifier; P+/N-well diode clamp; RF low-noise amplifier; current 6.5 mA; frequency 5.8 GHz; gain 16.7 dB; human body model; input third-order intercept point; modified silicon-controlled rectifier; size 65 nm; voltage 1.2 V; voltage 3.5 kV to 6.5 kV; CMOS technology; Circuit noise; Circuit topology; Diodes; Electrostatic discharge; Low-noise amplifiers; Noise measurement; Radio frequency; Radiofrequency amplifiers; Rectifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5517342
  • Filename
    5517342