Title :
Automatic System Level Test a Fault Location for Large Digital Systems
Author :
Yamada, A. ; Wakatsuki, N. ; Fukui, T. ; Funatsu, S.
Author_Institution :
Nippon Electric Co., Ltd., Tokyo, Japan
Abstract :
A system for automatic test generation and fault location, FLT-700, is described in this paper. It can treat large digital systems with 100K blocks (logic gates) or more. This is realized by utilizing Scan-Path concept, automatic partitioning and test generation techniques and automatic fault location technique. Serviceability for large computer systems can, therefore, be improved and easy maintenance realized.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Digital systems; Fault location; Flip-flops; Logic circuits; Logic testing; System testing; Test pattern generators;
Conference_Titel :
Design Automation, 1978. 15th Conference on
DOI :
10.1109/DAC.1978.1585196
