Title :
Self-referenced spectral interferometry for system drift compensating in thickness and index measurements
Author :
Na, Jihoon ; Choi, Hae Young ; ChangSu Lee ; Lee, Byeong Ha
Author_Institution :
Dept. of Inf. & Commun., Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
Abstract :
We presented a novel method for measuring the geometrical thickness and the group refractive index simultaneously by using a self-referenced spectral-domain fiber-based interferometry. The signal unintentionally originated from the fiber ends of both arms was utilized for the self-referencing.
Keywords :
geometrical optics; light interferometry; optical variables measurement; refractive index; thickness measurement; fiber-based interferometry; geometrical thickness; group refractive index; index measurements; self-referenced spectral-domain; spectral interferometry; system drift; thickness measurements; Arm; Biomedical measurements; Interference; Optical films; Optical interferometry; Optical refraction; Optical variables control; Superluminescent diodes; Thickness measurement; Wavelength measurement;
Conference_Titel :
OptoElectronics and Communications Conference, 2009. OECC 2009. 14th
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4102-0
Electronic_ISBN :
978-1-4244-4103-7
DOI :
10.1109/OECC.2009.5222717
