Title :
Optical emission bands in cubic GaN grown by MBE
Author :
Goldys, E.M. ; Godlewski, M. ; Drozdowicz-Tomsia, T. ; Langer, R. ; Baraki, A.
Author_Institution :
Semicond. Sci. & Technol. Labs., Macquarie Univ., North Ryde, NSW, Australia
Abstract :
We examine the proposition that mid-gap broad cathodoluminescence emission spectra of cubic and wurtzite GaN centered at 1.9 eV (red) and 2.2 eV (yellow) respectively are of similar origin. At high excitation levels, the red band shows a small blue shift comparable with the shallow-donor/deep-acceptor pair (DAP) recombination path proposed for the yellow band. The temperature dependence of peak energy supports this view, while band width and symmetry properties suggest that at least one of the defects in the DAP emission is strongly coupled to the lattice. Photoluminescence data point to donor and acceptor ionisation energies of about 15 meV and 100 meV respectively in the cubic phase. Energy dependence of emission decay times and peak energy migration are also indicative of DAP process. Finally we observe differences in surface micromorphology, flat and tesselated in cubic GaN and granulated in the wurtzite layers. Excitonic emission is suppressed at grain boundaries in both cases, while the respective red and yellow emission maps show little correlation with morphology
Keywords :
III-V semiconductors; cathodoluminescence; gallium compounds; molecular beam epitaxial growth; photoluminescence; semiconductor epitaxial layers; semiconductor growth; spectral line shift; wide band gap semiconductors; 1.9 eV; 2.2 eV; GaN; MBE grown cubic nitride; acceptor ionisation energy; donor ionisation energy; emission decay times; energy dependence; excitonic emission suppression; grain boundaries; granulated morphology; high excitation levels; mid-gap broad cathodoluminescence emission; optical emission bands; peak energy; photoluminescence data; red band; shallow-donor/deep-acceptor pair recombination; small blue shift; surface micromorphology; temperature dependence; tessellated morphology; time resolved luminescence; wurtzite layers; yellow band; Annealing; Digital audio players; Electrons; Gallium nitride; Ionization; Molecular beam epitaxial growth; Photoluminescence; Semiconductor films; Stimulated emission; Wavelength measurement;
Conference_Titel :
Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
0-7803-4513-4
DOI :
10.1109/COMMAD.1998.791620