DocumentCode :
3138381
Title :
Characterizing and predicting the I/O performance of HPC applications using a parameterized synthetic benchmark
Author :
Shan, Hongzhang ; Antypas, Katie ; Shalf, John
Author_Institution :
CRD/NERSC, Lawrence Berkeley Nat. Lab., Berkeley, CA, USA
fYear :
2008
fDate :
15-21 Nov. 2008
Firstpage :
1
Lastpage :
12
Abstract :
The unprecedented parallelism of new supercomputing platforms poses tremendous challenges to achieving scalable performance for I/O intensive applications. Performance assessments using traditional I/O system and component benchmarks are difficult to relate back to application I/O requirements. However, the complexity of full applications motivates development of simpler synthetic I/O benchmarks as proxies to the full application. In this paper we examine the I/O requirements of a range of HPC applications and describe how the LLNL IOR synthetic benchmark was chosen as suitable proxy for the diverse workload. We show a procedure for selecting IOR parameters to match the I/O patterns of the selected applications and show it can accurately predict the I/O performance of the full applications. We conclude that IOR is an effective replacement for full-application I/O benchmarks and can bridge the gap of understanding that typically exists between stand-alone benchmarks and the full applications they intend to model.
Keywords :
computational complexity; input-output programs; parallel programming; pattern matching; HPC application; I/O pattern matching; I/O performance prediction; LLNL IOR synthetic benchmark; high performance computing; parameterized synthetic benchmark; supercomputing platform; unprecedented parallelism; Benchmark testing; Bridges; Concurrent computing; Hardware; Laboratories; Parallel processing; Pattern matching; Permission; Petascale computing; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Computing, Networking, Storage and Analysis, 2008. SC 2008. International Conference for
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2834-2
Electronic_ISBN :
978-1-4244-2835-9
Type :
conf
DOI :
10.1109/SC.2008.5222721
Filename :
5222721
Link To Document :
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